Registration Dossier

Diss Factsheets

Administrative data

Endpoint:
nanomaterial crystalline phase
Type of information:
experimental study
Adequacy of study:
key study
Study period:
10th April 2018
Reliability:
1 (reliable without restriction)

Data source

Reference
Reference Type:
study report
Title:
Unnamed
Year:
2018

Materials and methods

GLP compliance:
no
Remarks:
but study conducted in a laboratory holding a current statement of GLP compliance.
Type of method:
x-ray diffraction (XRD)
Details on methods and data evaluation:
A quantity of the test substance, titanium nitride, the sample was transferred into a front-fill sample holder and levelled using ground glass, before transfer to the instrument for analysis.

Test material

Constituent 1
Chemical structure
Reference substance name:
Titanium nitride
EC Number:
247-117-5
EC Name:
Titanium nitride
Cas Number:
25583-20-4
Molecular formula:
NTi
IUPAC Name:
titanium nitride
Test material form:
solid: nanoform

Data gathering

Instruments:
Bruker D4 Endeavor XRD, LIMS 2207, SOP 019.00 and 019.05

Instrument parameters

Range: 5 °2θ to 70 °2θ (in conventional reflection mode)
Step: 0.014 °
Scan: 1 second
Detector: PSD
Slit: 0.6 mm
Source: Copper K-Alpha radiation, WL=1.54060
Intensity: 40 mA
Voltage: 40 kV

Results and discussion

Any other information on results incl. tables

The diffractogram indicates the material is crystalline in nature, with major peaks at-

36.638 °2θ

42.569 °2θ

61.787 °2θ

 

The diffractogram is a good match with Powder Diffraction File*(PDF) 03-065-0565 N Ti Titanium Nitride.

 

*File from the ICDD – International Centre for Diffraction Data.

Applicant's summary and conclusion

Conclusions:
XRD diffractogram indicates that TiN is crystalline in nature.